@inproceedings{SeyringerSagmeisterMaeseNovoetal.2020, author = {Dana Seyringer and Martin Sagmeister and Alejandro Maese-Novo and Moritz Eggeling and Elisabet A. Rank and Johannes Edlinger and Paul Muellner and Rainer Hainberger and Wolfgang Drexler and Jochen Kraft and Guenther Koppitsch and Gerald Meinhardt and Marko Vlaskovic and Horst Zimmermann}, title = {Compact and high-resolution 256-channel silicon nitride based AWG-spectrometer for OCT on a chip}, series = {ICTON 2019. 21st International Conference on Transparent Optical Networks. 9-13 July 2019, Angers, France}, editor = {Marek Jaworski and Marian Marciniak}, publisher = {National Institute of Telecommunications}, address = {Warsaw, Poland}, isbn = {978-1-7281-2779-8}, doi = {10.1109/ICTON.2019.8840473}, year = {2020}, abstract = {We present design, simulation and technological verification of a compact 256-channel, 42-GHz silicon nitride based AWG-spectrometer. The spectrometer was designed for TM-polarized light with a central wavelength of 850 nm, applying “AWG-Parameters” tool. This design is based on a previous study of various AWG designs (8-channel, 100-GHz; 20-channel, 50-GHz; 40-channel, 50-GHz, 80-channel, 50-GHz and 160-channel, 50-GHz AWGs), which were all technologically verified. The spectrometer features small size and high resolution. It is integrated on OCT chip using standard CMOS processes. The SD-OCT system is developed to operate in a wavelength range from 800 nm to 900 nm, having 0.1 nm resolution.}, language = {en} }