TY  - CHAP
U1  - Konferenzveröffentlichung
A1  - Seyringer, Dana
A1  - Sagmeister, Martin
A1  - Maese-Novo, Alejandro
A1  - Eggeling, Moritz
A1  - Rank, Elisabet A.
A1  - Edlinger, Johannes
A1  - Muellner, Paul
A1  - Hainberger, Rainer
A1  - Drexler, Wolfgang
A1  - Kraft, Jochen
A1  - Koppitsch, Guenther
A1  - Meinhardt, Gerald
A1  - Vlaskovic, Marko
A1  - Zimmermann, Horst
ED  - Jaworski, Marek
ED  - Marciniak, Marian
T1  - Compact and high-resolution 256-channel silicon nitride based AWG-spectrometer for OCT on a chip
T2  - ICTON 2019. 21st International Conference on Transparent Optical Networks. 9-13 July 2019, Angers, France
N2  - We present design, simulation and technological verification of a compact 256-channel, 42-GHz silicon nitride based AWG-spectrometer. The spectrometer was designed for TM-polarized light with a central wavelength of 850 nm, applying “AWG-Parameters” tool. This design is based on a previous study of various AWG designs (8-channel, 100-GHz; 20-channel, 50-GHz; 40-channel, 50-GHz, 80-channel, 50-GHz and 160-channel, 50-GHz AWGs), which were all technologically verified. The spectrometer features small size and high resolution. It is integrated on OCT chip using standard CMOS processes. The SD-OCT system is developed to operate in a wavelength range from 800 nm to 900 nm, having 0.1 nm resolution.
KW  - Arrayed waveguide gratings
KW  - high-index contrast AWG
KW  - Si3N4 based AWG spectrometer
KW  - optical coherence tomography
KW  - OCT on-chip
Y1  - 2019
SN  - 978-1-7281-2779-8
SB  - 978-1-7281-2779-8
U6  - https://doi.org/10.1109/ICTON.2019.8840473
DO  - https://doi.org/10.1109/ICTON.2019.8840473
SP  - 4
S1  - 4
PB  - National Institute of Telecommunications
CY  - Warsaw, Poland
ER  -