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Cryogenic surface ion trap based on intrinsic silicon

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Author:Michael Niedermayr, Kirill Lakhmanskiy, Muir Kumph, Stefan Partel, Johannes Edlinger, Michael Brownnutt, Rainer Blatt
DOI:https://doi.org/10.1088/1367-2630/16/11/113068
ISSN:1367-2630
Parent Title (English):New Journal of Physics
Document Type:Article
Language:English
Year of publication:2014
Release Date:2018/11/22
Volume:16. Jg.
Issue:H. 11
Number og pages:11
Organisationseinheit:Forschung / Forschungszentrum Mikrotechnik
Publicationlist:Edlinger, Johannes
Partel, Stefan