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Cryogenic surface ion trap based on intrinsic silicon
Author: | Michael Niedermayr, Kirill Lakhmanskiy, Muir Kumph, Stefan Partel, Johannes Edlinger, Michael Brownnutt, Rainer Blatt |
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DOI: | https://doi.org/10.1088/1367-2630/16/11/113068 |
ISSN: | 1367-2630 |
Parent Title (English): | New Journal of Physics |
Document Type: | Article |
Language: | English |
Year of publication: | 2014 |
Release Date: | 2018/11/22 |
Volume: | 16. Jg. |
Issue: | H. 11 |
Number of pages: | 11 |
Organisationseinheit: | Forschung / Forschungszentrum Mikrotechnik |
Publicationlist: | Edlinger, Johannes |
Partel, Stefan |