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Compact and high-resolution 256-channel silicon nitride based AWG-spectrometer for OCT on a chip

  • We present design, simulation and technological verification of a compact 256-channel, 42-GHz silicon nitride based AWG-spectrometer. The spectrometer was designed for TM-polarized light with a central wavelength of 850 nm, applying “AWG-Parameters” tool. This design is based on a previous study of various AWG designs (8-channel, 100-GHz; 20-channel, 50-GHz; 40-channel, 50-GHz, 80-channel, 50-GHz and 160-channel, 50-GHz AWGs), which were all technologically verified. The spectrometer features small size and high resolution. It is integrated on OCT chip using standard CMOS processes. The SD-OCT system is developed to operate in a wavelength range from 800 nm to 900 nm, having 0.1 nm resolution.

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Author:Dana Seyringer, Martin Sagmeister, Alejandro Maese-Novo, Moritz Eggeling, Elisabet A. Rank, Johannes Edlinger, Paul Muellner, Rainer Hainberger, Wolfgang Drexler, Jochen Kraft, Guenther Koppitsch, Gerald Meinhardt, Marko Vlaskovic, Horst Zimmermann
Parent Title (English):ICTON 2019. 21st International Conference on Transparent Optical Networks. 9-13 July 2019, Angers, France
Publisher:National Institute of Telecommunications
Place of publication:Warsaw, Poland
Editor:Marek Jaworski, Marian Marciniak
Document Type:Conference Proceeding
Year of publication:2019
Release Date:2020/01/16
Tag:Arrayed waveguide gratings; OCT on-chip; Si3N4 based AWG spectrometer; high-index contrast AWG; optical coherence tomography
Number og pages:4
Organisationseinheit:Forschung / Forschungszentrum Mikrotechnik
DDC classes:600 Technik, Medizin, angewandte Wissenschaften
Publicationlist:Edlinger, Johannes
Seyringer, Dana
Bibliographie 2019
Licence (German):License LogoUrhG - The Austrian Copyright Act applies - Es gilt das österr. Urheberrechtsgesetz