Compact and high-resolution 256-channel silicon nitride based AWG-spectrometer for OCT on a chip
- We present design, simulation and technological verification of a compact 256-channel, 42-GHz silicon nitride based AWG-spectrometer. The spectrometer was designed for TM-polarized light with a central wavelength of 850 nm, applying “AWG-Parameters” tool. This design is based on a previous study of various AWG designs (8-channel, 100-GHz; 20-channel, 50-GHz; 40-channel, 50-GHz, 80-channel, 50-GHz and 160-channel, 50-GHz AWGs), which were all technologically verified. The spectrometer features small size and high resolution. It is integrated on OCT chip using standard CMOS processes. The SD-OCT system is developed to operate in a wavelength range from 800 nm to 900 nm, having 0.1 nm resolution.
Author: | Dana SeyringerORCiD, Martin Sagmeister, Alejandro Maese-Novo, Moritz Eggeling, Elisabet A. Rank, Johannes Edlinger, Paul Muellner, Rainer Hainberger, Wolfgang Drexler, Jochen Kraft, Guenther Koppitsch, Gerald Meinhardt, Marko Vlaskovic, Horst Zimmermann |
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DOI: | https://doi.org/10.1109/ICTON.2019.8840473 |
ISBN: | 978-1-7281-2779-8 |
Parent Title (English): | ICTON 2019. 21st International Conference on Transparent Optical Networks. 9-13 July 2019, Angers, France |
Publisher: | National Institute of Telecommunications |
Place of publication: | Warsaw, Poland |
Editor: | Marek Jaworski, Marian Marciniak |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2019 |
Release Date: | 2020/01/16 |
Tag: | Arrayed waveguide gratings; OCT on-chip; Si3N4 based AWG spectrometer; high-index contrast AWG; optical coherence tomography |
Number of pages: | 4 |
Organisationseinheit: | Forschung / Forschungszentrum Mikrotechnik |
DDC classes: | 600 Technik, Medizin, angewandte Wissenschaften |
Publicationlist: | Edlinger, Johannes |
Seyringer, Dana | |
Licence (German): |